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As per available reports about 10 relevant journals, 71 Conferences, 6 workshops are presently dedicated exclusively to Ion spectroscopy and about 1543 articles are being published on Ion spectroscopy.
Ion mass spectrometry (IMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm. Due to the large variation in ionization probabilities among different materials, IMS is generally considered to be a qualitative technique, although quantitation is possible with the use of standards. IMS is the most sensitive surface analysis technique, with elemental detection limits ranging from parts per million to parts per billion. The main aspects include: Applications of mass spectrometry, New approaches in mass spectrometry, Recent advances and developments in Mass spectrometry and Mass spectrometry imaging.
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Scope and Importance:
Ion spectroscopy Conference provides the scope for opportunities to learn progressed by international scientists and academicians. Conferences will enhance the knowledge of all the participants in different fields and will be a varied combination of eminent speakers, industry professionals, social activist, students and research scholars. Ion spectroscopy Conference offers excessive quality content to suit the diverse professional development of these medicines to treat people all over the globe.
When a beam of ions hits a solid surface part of the projectiles will be scattered back into the vacuum after one or more collisions with target atoms of the top few layers. Measurement of the energy of the backscattered particles can be used to identify the mass of the these atoms. The technique is called Ion Scattering Spectroscopy (ISS). The term encompasses actually several techniques depending on the energy of the primary ion beam. LEIS (Low Energy Ion Scattering) spectroscopy is referred to primary energies in the range of 100 eV to 10 keV, Medium Energy Ion Scattering (MEIS) to a range from 100 to 200 keV, and High Energy Ion Scattering (HEIS) to energies between 1 and several MeV. Often the LEIS technique is called Ion Scattering Spectroscopy (ISS), the term we will use below meaning LEIS, while HEIS technique is best known as Rutherford Backscattering Spectroscopy (RBS).
Advantages and disadvantages
Low energy ion scattering is attractive as a surface-specific technique. Spectra are usually obtained using noble gas ion beams from 0.5 to 5 keV. Due to strong electron affinity of inert-gas ions the probability of electron transfer is very high even in the initial collision with a surface atom. After two or more collisions most ions will be neutralized, so that a detector set to analyze only ions of the same type as those in the incident beam will detect almost entirely ions that have had only one collision with a target atom. Projectiles entering the solid will be discarded since they would need several scattering events to return back to the surface and exit. Unless specific experimental arrangements such as sliding angle incidence are made, multiple collisions will contribute to the background of the energy spectrum only. Thus by measuring the spectrum of backscattered ions and using the equation above one can easily determine the target mass, therefore the kind of atoms on the surface. Note that the energy after two collisions depend on the distance between the scattering atoms, and this energy peak can be used to estimate the interatomic distance on the surface in the scattering plane (incl. the incident and the scattered beams). By rotating the target under the incident beam one can determine the surface arrangement of the atoms in the various azimuthal directions of the top layer.
The practical use of IIS is determined by its extreme sensitivity to only the top surface layer (for standard experimental arrangements) or two monolayers (for grazing incidence). Typical applications include composition of catalytic surfaces, thin film coatings, adhesion, as well as arrangement of surface atoms incl. the localization of adsorbed atoms.
As per the Frost and Sullivan report analytical market is growing on an average 0.4% annually. This report studies the global mass spectrometry market over the forecast period of 2013 to 2018. The market was estimated at $3.9 billion in 2013 and is expected to reach $5.9 billion by 2018, growing at a CAGR of 8.7% from 2013 to 2018.North America dominated the global mass spectrometry market in 2013, followed by Europe and Asia. The North American market is likely to be driven by factors such as the increasing number of government investments in pharmaceutical, biotechnology, medical, and academic research studies that make use of mass spectrometry techniques. On the other hand, Asia is expected to grow at the highest CAGR due to the presence of high-growth markets such as India and China, the improved funding scenario in this region, increasing number of conferences and exhibitions on mass spectrometry, and increased focus of the giant players in these countries.
International symposium and workshops
List of Best International Conferences:
21st Mass Spectrometry Conference
20-26 Aug 2016, Toronto, Canada.
Application of NMR Spectroscopy in Pharmaceutical Industry
23-25 Sep 2015, Rovinj, St. Andrew Island, Croatia.
9th Solid-State NMR: New Concepts and Applications
13-17 Sep 2015, Chamonix-Mont-Blanc, France.
Relevant Society and Associations
This page will be updated regularly.
This page was last updated on 14th Sep, 2015
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