International Conferences

Meet Inspiring Speakers and Experts at our 3000+ Global Conference Series Events with over 1000+ Conferences, 1000+ Symposiums
and 1000+ Workshops on Medical, Pharma, Engineering, Science, Technology and Business.

Explore and learn more about Conference Series : World's leading Event Organizer

 

Recommended Conferences for Electron Microscope

Electron Microscope


The electron microscope is a type of microscope that uses electrons to create an image of the target. It has much higher magnification or resolving power than a normal light microscope. The electron microscope is an integral part of many laboratories. Although modern electron microscopes can magnify objects up to two million times, they are still based upon Ruska's prototype and his correlation between wavelength and resolution. Researchers use it to examine biological materials (such as microorganisms and cells), a variety of large molecules, medical biopsy samples, metals and crystalline structures, and the characteristics of various surfaces. The transmission electron microscope uses electrostatic and electromagnetic lenses to control the electron beam and focus it to form an image. These electron optical lenses are analogous to the glass lenses of an optical light microscope. Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, the electron microscope is often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs, using specialized digital cameras or frame grabbers to capture the image. Electron microscopes mainly focuses on electromagnetic and/or electrostatic lenses to control the path of electrons. Glass lenses, used in light microscopes, have no effect on the electron beam. The basic design of an electromagnetic lens is a solenoid (a coil of wire around the outside of a tube) through which one can pass a current, thereby inducing an electromagnetic field. The electron beam passes through the centre of such solenoids on its way down the column of the electron microscope towards the sample. Electrons are very sensitive to magnetic fields and can therefore be controlled by changing the current through the lenses. The faster the electrons travel, the shorter their wavelength. The resolving power of a microscope is directly related to the wavelength of the irradiation used to form an image. Reducing wavelength increases resolution. Therefore, the resolution of the microscope is increased if the accelerating voltage of the electron beam is increased. The accelerating voltage of the beam is quoted in kilovolts (kV). It is now possible to purchase a 1,000kV electron microscope, though this is not commonly found. Hereby classifying to Transmission Electron Microscope (TEM) and Scanning Electron Microscope (SEM) The original form of electron microscopy, Transmission electron microscopy (TEM) involves a high voltage electron beam emitted by a cathode and formed by magnetic lenses. The electron beam that has been partially transmitted through the very thin (and so semitransparent for electrons) specimen carries information about the structure of the specimen. The spatial variation in this information (the "image") is then magnified by a series of magnetic lenses until it is recorded by hitting a fluorescent screen, photographic plate, or light sensitive sensor such as a CCD (charge-coupled device) camera. The image detected by the CCD may be displayed in real time on a monitor or computer. Transmission electron microscopes produce two-dimensional, black and white images. Unlike the TEM, where the electrons in the primary beam are transmitted through the sample, the Scanning Electron Microscope (SEM) produces images by detecting secondary electrons which are emitted from the surface due to excitation by the primary electron beam. In the SEM, the electron beam is scanned across the surface of the sample in a raster pattern, with detectors building up an image by mapping the detected signals with beam position.

OMICS Group Special Features:
OMICS Group is the leading event organizers which host more than 300 International Conferences across the globe. OMICS group organizes scientific conferences on Clinical Sciences, Engineering & Applied Sciences, Life Sciences, Medical Sciences, Healthcare, Pharmaceutical, Chemistry and it's an ideal platform for international networking. OMICS Publishing Group manages over 400 peer reviewed Open Access Journals in all field of research and practical applications. OMICS group hosts 400 Open Access journals with over 3.5 million readers and therefore the honor and success of an equivalent are often attributed to the robust editorial board that contains over 30000 eminent personalities. These scientific events are emerging as one of the best gathering with the support from 1000 International Collaborations with renowned scientific societies and institutes. OMICS Group International events offer exciting chance to showcase the services of your company to the global audience.
Electron Microscope Manufactures:
•High performance Microscopy Workflow Solutions
•FEI Company
•JEOL Scanning Electron Microscope, USA
•TEM Manufactures

Electron Microscope Society:
•National society of America
•Microscopy society of America
•Oklahoma Microscopy society
•Electron microscopy society of India
•European microscopy society
•Royal microscopical society
•Society of Electron microscope
•Chinese Electron Microscopy Society
•Association of Clinical Electron microscopists

Special Features–OMICS Group Conferences 300 Conferences all over the world in 2014 Well organized workshops, events and symposia Renowned speakers and scientists across the globe Poster presentations and world class exhibits Panel discussions & interactive sessions Perfect platform for global networking B2B meetings Alliances and associations Collaborative Research opportunities Supported by reputed associations and societies

National Symposiums:
•International conference on scanning probe microscopy on soft and polymeric materials, Toronto, Canada.
•18th The International Microscopy Congress 2014, Prague, Czech Republic
•XV International conference on Electron Microscopy. Poland
•Labelling and Nanoscopy, Germany
•Optics and Measurement 2014, Czech Republic
•2nd Conference on In-situ and Correlative Electron Microscope, Germany
•2nd International Multidisciplinary Microscopy and Microanalysis Congress and Exhibition, Turkey
•12th International Conference on x-ray Microscopy, Australia
•EMBO Practical course – Single Molecule and single cell fluorescence microscopy, Germany
• Novel Techniques in Microscopy, Canada
•EMBO Practical course- Advanced electron microscopy for cell biology, France
•Microscience Microscopy Congress, United Kingdom
•Microscopy and Microananalysis 2015,USA
•12th Multinational Congress on Microscopy, Hungary
•Single Molecule Microscopy and Spectroscopy, UK
•16th European Microscopy Congress

This page will be updated regularly.

This page was last updated on March 28, 2024

Conference Series Destinations